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Nearfield Instruments Quadra We love hightech 3D visualisation

Nearfield Instruments Quadra - High Throughput Scanning Probe Microscopy

Nearfield Instruments introduceert grensverleggende technologie met de High-Throughput Scanning Probe Microscopy metrologie-opstelling, door gebruik te maken van vier gepatenteerde high-speed geminiaturiseerde atoomkrachtmicroscopen in parallel én in één enkele opstelling. Wij ontwikkelden deze High Tech 3D visualisatie.

Expertises
3D / Animatie
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High-tech / Innovatie
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Nearfield Instruments
Nearfield Instruments Quadra Overview setup 3D visualisation
Nearfield Instruments Quadra 3D slice
Nearfield Instruments Quadra Scanning Probe Microscopy Up
Nearfield Instruments Quadra Scanning Probe Microscopy Wafer transport
Nearfield Instruments Quadra Probe Pickup 3D inside view
Nearfield Instruments Quadra How it looks inside 3D visualisation
Nearfield Instruments Quadra Wafer Marker 3D closeup
Nearfield Instruments Quadra Probe Pickup Close up 3D hightech

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