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Nearfield Instruments Quadra We love tech 3 D visualisation

Nearfield Instruments Quadra - High Throughput Scanning Probe Microscopy

High Throughput Scanning Probe Microscopy for Semiconductor Metrology. Wij ontwikkelden deze High Tech 3D visualisatie.

Expertises
3D / Animation
Sektors
High-tech / Innovation
Kunde
Nearfield Instruments
Nearfield Instruments Quadra Overview setup 3 D visualisation
Nearfield Instruments Quadra 3 D slice
Nearfield Instruments Quadra Scanning Probe Microscopy Up
Nearfield Instruments Quadra Scanning Probe Microscopy Wafer transport
Nearfield Instruments Quadra Probe Pickup 3 D inside view
Nearfield Instruments Quadra How it looks inside 3 D visualisation
Nearfield Instruments Quadra Wafer Marker 3 D closeup
Nearfield Instruments Quadra Probe Pickup Close up 3 D hightech

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